Time of Flight Diffraction Level II Refresher

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This course is targeted for learners who have already completed their ToFD Level II and are looking for an opportunity to have a refresher of the time of flight diffraction content. Students can freely navigate the condensed training materials and target specific content according to their needs. This course does NOT satisfy the requirements for ToFD for SNT-TC-1A and there is no final exam. If you are needing to complete the 80-hour Phased Array course, please purchase the full version of the course here.


See below for additional information related to the differences between the Time of Flight Diffraction Level II course and the Time of Flight Diffraction Level II Refresher.


Course is now available in English and Spanish. Videos will be in English with all other course material in the selected language. Learners can alternate between languages within the course. 


Member: $510
Nonmember/Associate: $545
*For member pricing, upgrade your membership.

Important: Within 24-48 business hours after registration for this course, learners will receive instructions on how to complete this course on a third-party site. Email education@asnt.org with any questions.
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On-demand
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Virtual
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Self-paced

Credit Info

  • Contact Hours: 20 
  • IACET CEUs: N/A 
  • Valid for ASNT Level III recertification: Yes

Course Overview

Our TOFD Level II Refresher, based on ASNT and ISO Standards topical outlines, is designed for technicians seeking to reinforce and update their Time of Flight Diffraction (TOFD) knowledge and skills. The course covers manual, automated, and semi-automated TOFD, blending a self-assessment with targeted theory and hands-on exercises. Participants will revisit essential instrument functions, probe and signal fundamentals, data acquisition techniques, and analysis methods. Practical exercises reinforce key concepts, ensuring learners are confident in calibration, scanning, and data interpretation for a variety of inspection scenarios.

Upon Completion, Learners Will Have Covered:

  • ToFD system components: instruments, digitizers, filters, probes
  • Acoustic principles: frequency, waveform, pitch and catch, diffraction, Snell's law
  • Data formats and displays: B-Scan, gray scale, cursors, whisker effect
  • Scanning methods: parallel/non-parallel, PCS, beam spread, lateral wave, backwall
  • Flaw characterization: surface-breaking, embedded, geometric indications
  • System optimization: filters, averaging, time window, sensitivity, scan resolution, PRF
  • Calibration: velocity, beam index point, wedge delay, lateral wave straightening
  • Analysis: signal interpretation, grouping, flaw sizing (height, depth, length, position)
  • Limitations: dead zones, accuracy, resolution


Questions? Contact us at education@asnt.org

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